发明名称 PROGRAMMING METHOD OF FLASH MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a programming method of a flash memory element for preventing occurrence of a program disturbance phenomenon wherein the threshold voltage of a program-inhibited cell is changed, by increasing a channel boosting potential. <P>SOLUTION: By turning on all of memory cells in a string, a ground voltage is applied to a first bit line connected with a first string including the cell to be programmed while all of channel areas are electrically connected, and a program inhibiting voltage is applied to a second bit line connected with a second string including the program-inhibited cell so that the all of channel areas in the second string are uniformly precharged. When the programming operation is executed, the channel boosting occurs in the all of channel areas in the second string including the program-inhibited cell. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009070537(A) 申请公布日期 2009.04.02
申请号 JP20080017006 申请日期 2008.01.29
申请人 HYNIX SEMICONDUCTOR INC 发明人 LEE HEE YOUL
分类号 G11C16/02;G11C16/04;G11C16/06;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 G11C16/02
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