发明名称 SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND METHOD OF CLEANING SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To improve a manufacturing yield of semiconductor apparatus. SOLUTION: The substrate processing apparatus has a heating chamber 2 for carrying a substrate 9 therein, a heating mechanism 3B for heat-treating the substrate 9, an ion generating mechanism 4 for ionizing a supplied gas to generate ions 12, and a dust collecting plate 5 for electrifying a dust to be charged to the opposite polarity of the ions 12. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009032809(A) 申请公布日期 2009.02.12
申请号 JP20070193615 申请日期 2007.07.25
申请人 TOSHIBA CORP 发明人 KIYONO YURIKO
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
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