| 摘要 |
PROBLEM TO BE SOLVED: To provide an optoelectronic circuit substrate in which troubles of a light emitting part and an optical waveguide part or the like are inspected after an optical module is mounted on a circuit substrate. SOLUTION: A mirror 10E is provided on the core layer 100 of the optical waveguide 10C. An open part 10b is provided on a second substrate 10B facing the mirror 10E, a light source for inspection 14 is installed in a way that inspection light can be introduced into the open part 10b. When the inspection light from the light source for inspection 14 arrives at the optical module on a receiving side via the core layer 100, the inspection is performed with an inspection apparatus 20 depending on the light intensity of the light received by a light-receiving element of the optical module on the receiving side. COPYRIGHT: (C)2009,JPO&INPIT |
