发明名称 SPECTRAL CHARACTERISTIC MEASURING APPARATUS AND SPECTRAL CHARACTERISTIC MEASURING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a spectral characteristic measuring apparatus and spectral characteristic measuring system allowing a user to easily manage the accuracy of measurement. SOLUTION: When an accuracy recognizing switch is pushed (YES in #11), a control section calculates a wavelength shift amountΔλusing a white calibration plate and a xenon flash lamp (#12-#17), and calculates a spectral reflectance characteristic obtained by shifting the spectral reflectance characteristic stored in a spectro-colorimeter 1 at the factory delivery by the wavelength shift amountΔλ(#18). The control section compares the spectral reflectance characteristic (c) with a previously stored spectral reflectance characteristic (a) obtained by a measuring operation by a master machine, calculates the error of the spectral reflectance characteristic (c) from the spectral reflectance characteristic (a) obtained by the measuring operation by the master machine, and displays the error on a display section (#20). COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009008561(A) 申请公布日期 2009.01.15
申请号 JP20070170885 申请日期 2007.06.28
申请人 KONICA MINOLTA SENSING INC 发明人 KOBAYASHI TORU;SATO MAKOTO
分类号 G01J3/02;G01J3/50 主分类号 G01J3/02
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