发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithographic apparatus includes a support structure configured to hold a patterning device, the patterning device configured to pattern a beam of radiation according to a desired pattern, a substrate table configured to hold a substrate and a projection system configured to project the beam as patterned onto a target portion of the substrate. The lithographic apparatus further includes a polarization modifier disposed in a path of the beam. The polarization modifier comprises a material having a radially varying birefringence.
申请公布号 US7423727(B2) 申请公布日期 2008.09.09
申请号 US20050041873 申请日期 2005.01.25
申请人 ASML NETHERLANDS B.V. 发明人 TOTZECK MICHAEL;GEH BERND PETER;MILLER SKIP
分类号 G03B27/64 主分类号 G03B27/64
代理机构 代理人
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