发明名称 METHOD FOR FORMING METAL SILICIDE LAYER
摘要 The invention provides a method for forming a metal silicide layer. The method comprises steps of providing a substrate and forming a nickel-noble metal layer over the substrate. A grain boundary sealing layer is formed on the nickel-noble metal layer and then an oxygen diffusion barrier layer is formed on the grain boundary sealing layer. Thereafter, a rapid thermal process is performed to transform a portion of the nickel-noble metal layer into a metal silicide layer. Finally, the oxygen diffusion barrier layer, the grain boundary sealing layer and the rest portion of the nickel-noble metal layer are removed.
申请公布号 US2008194100(A1) 申请公布日期 2008.08.14
申请号 US20070673145 申请日期 2007.02.09
申请人 UNITED MICROELECTRONICS CORP. 发明人 HUNG TZUNG-YU;CHANG CHUN-CHIEH;HSIEH CHAO-CHING;CHANG YU-LAN;CHEN YI-WEI
分类号 H01L21/44 主分类号 H01L21/44
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