发明名称 PROCESSES FOR MONITORING THE LEVELS OF OXYGEN AND/OR NITROGEN SPECIES IN A SUBSTANTIALLY OXYGEN AND NITROGEN-FREE PLASMA ASHING PROCESS
摘要 Processes for monitoring the levels of oxygen and/or nitrogen in a substantially oxygen and nitrogen-free plasma ashing process generally includes monitoring the plasma using optical emission. An effect produced by the low levels of oxygen and/or nitrogen species present on other species generally abundant in the plasma is monitored and correlated to amounts of oxygen and nitrogen present in the plasma. This so-called "effect detection" process monitors perturbations in the spectra specifically associated with species other than nitrogen and/or oxygen due to the presence of trace amounts of oxygen and/or nitrogen species and is used to quantitatively determine the amount of oxygen and/or nitrogen at a sensitivity on the order of 1 part per million and potentially 1part per billion.
申请公布号 WO2007111823(A3) 申请公布日期 2008.01.24
申请号 WO2007US06071 申请日期 2007.03.09
申请人 AXCELIS TECHNOLOGIES, INC.;SAKTHIVEL, PALANIKUMARAN;BUCKLEY, THOMAS;BECKNELL, ALAN 发明人 SAKTHIVEL, PALANIKUMARAN;BUCKLEY, THOMAS;BECKNELL, ALAN
分类号 G03F7/42 主分类号 G03F7/42
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