| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a reliable and long-life zener zap PROM circuit used for a long time even when a zener zap element including a thin Al filament formed by zapping at a low current of about 10 to 20 mA is used. <P>SOLUTION: Only in a read mode before a change to a normal operation mode, a read current is applied to a zener zap element 1 to read data of each bit, and the data is output to a latch circuit 6. During a normal circuit operation, the data read in the read mode is output from the latch circuit 6 without applying any current to the zener zap element 1. <P>COPYRIGHT: (C)2008,JPO&INPIT |
