发明名称 Lithographic apparatus and patterning device
摘要 A mask for a lithographic apparatus is disclosed, the mask having a patterned region bearing a pattern to be transferred onto a substrate and a border surrounding the patterned region, wherein at least part of the border has a plurality of elements, the dimensions of the elements being such that, during use, they would not be resolved at the substrate. Also, a lithographic apparatus is disclosed, the apparatus having a projection system, a substrate table arranged to hold a substrate, and a patterning device having a patterned region which bears a pattern to be transferred using a radiation beam via the projection system onto the substrate, at least part of a border surrounding the patterned region comprising a plurality of elements arranged to direct radiation onto the substrate, the dimensions of the elements such that, during use, they are not resolved at the substrate.
申请公布号 US2007231709(A1) 申请公布日期 2007.10.04
申请号 US20060391682 申请日期 2006.03.29
申请人 ASML NETHERLANDS B.V. 发明人 MICKAN UWE;DIJSSELDONK ANTONIUS JOHANNES J.
分类号 G03B27/42;G03F1/00 主分类号 G03B27/42
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