发明名称 METHOD AND DEVICE FOR INSPECTING SURFACE DEFECT OF DISC
摘要 PROBLEM TO BE SOLVED: To provide a method and a device for inspecting a surface defect of a disc, capable of shortening a handling time for the disc to enhance a through-put for disc inspection. SOLUTION: In this method/device of the present invention, the disc stored in a disc cassette is pushed out of a bottom face side of the disc cassette toward a front side of the disc cassette, to be moved to an inspection position in an outside adjacent to the disc cassette, the disc set in the inspection position is moved longitudinally with respect to the disc cassette under the condition as it is, and the disc is scanned with a light beam to inspect the defect of the disc. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007256133(A) 申请公布日期 2007.10.04
申请号 JP20060082113 申请日期 2006.03.24
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SERIKAWA SHIGERU;ISHIGURO TAKAYUKI;SUZUKI RYUTA
分类号 G01N21/95;G01B11/30;G11B5/84 主分类号 G01N21/95
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