发明名称 AUTOMATIC TESTING EQUIPMENT INSTRUMENT CARD AND PROBE CABLING SYSTEM AND APPARATUS
摘要 <p>A device for interfacing a test head and a prober is disclosed using wires or cables to provide the connection from a probe card interface boards to the probe card. The use of wires or cables, in place of the traditional pogo pin arrangement allows for more reliable and efficient testing, as well as additional high performance tests to be run. Optionally, a probe interface contains a stiffening member with multiple sidewalks and individual, configuration-specific probe card interface strips are connected to a probe card through zero insertion force clamps. The probe card interface attaches to the test head using standard probe interface board ("PIB") docking mechanics. The assembly is then connected to a probe to carry out the testing procedures.</p>
申请公布号 WO2007081421(A1) 申请公布日期 2007.07.19
申请号 WO2006US41964 申请日期 2006.10.27
申请人 TERADYNE, INC.;PARRISH, FRANK, B.;BEHZIZ, ARASH 发明人 PARRISH, FRANK, B.;BEHZIZ, ARASH
分类号 G01R31/28;G01R1/073 主分类号 G01R31/28
代理机构 代理人
主权项
地址