Elektrische Ermittlung der Dicke von Halbleitermembranen durch Energieeintrag,申请号DE200511002169T-传众专利搜索

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发明名称	Elektrische Ermittlung der Dicke von Halbleitermembranen durch Energieeintrag
摘要
申请公布号	DE112005002169(A5)	申请公布日期	2007.07.12
申请号	DE200511002169T	申请日期	2005.10.20
申请人	X-FAB SEMICONDUCTOR FOUNDRIES AG	发明人	HERING, SIEGFRIED;HOELZER, GISBERT
分类号	G01B21/08;G01N25/18	主分类号	G01B21/08
代理机构		代理人
主权项
地址

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