发明名称 A TEST POINT STRUCTURE OF PCB
摘要 A test point structure of a PCB(Printed Circuit Board) is provided to improve accuracy of a test and to allow a tester to perform debugging by maintaining a stable contact state between a test pin and a test point. A test point structure of a PCB(20) includes a mounting hole(21) for inserting and soldering a lead(12) formed on an integrated circuit(10). A test point(23) is formed at an end part of a test wire(22) connected to the mounting hole(21). An upper part of the test point(23) has a concave shape. An additional projection for preventing separation of a test pin(31) is formed at the upper part of the test point(23).
申请公布号 KR20070065152(A) 申请公布日期 2007.06.22
申请号 KR20050125876 申请日期 2005.12.19
申请人 DAEWOO ELECTRONICS CORPORATION 发明人 KIM, SE JUN
分类号 H05K13/08 主分类号 H05K13/08
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