Contaminant particle identification and compensation with multichannel information during scanner calibration

摘要

Methods of identifying the location and dimensions of a contaminant particle on a calibration strip may be used to compensate for contaminant particles on a calibration strip. A method of locating a contaminant particle on a calibration strip comprises imaging a calibration strip comprising a plurality of channels arranged in rows and a plurality of pixel columns, wherein each channel comprises a plurality of horizontally adjacent pixels, and each pixel column comprises pixels from a plurality of channels. The method also includes generating an average pixel intensity value by normalizing the channels and locating a contaminant particle in a pixel column by comparing the intensity of an individual pixel in the pixel column to the average pixel intensity value. An intensity value of an individual pixel less than a predefined limit set below the normalized local average pixel intensity value corresponds to a location of a contaminant particle. The method further includes identifying the number of adjacent pixels in a pixel column less than a predefined limit set below the normalized local average pixel intensity value.