发明名称 MASK FOR FORMING ISOLATED PATTERN AND METHOD OF FORMING THE ISOLATED PATTERN USING THE SAME
摘要 <p>A mask for forming an isolated pattern and a forming method of the isolated pattern using the same are provided to improve depth of focus by arranging a phase shift region at both sides of the isolated pattern. A mask for forming an isolated pattern includes a transparent substrate(400), a halftone layer(410) formed on the transparent substrate corresponding to the isolated pattern, and a phase shift region(430) formed at both sides of the halftone pattern in order to have the phase difference of 90-270 degree. A light shielding layer(422) is formed on the halftone layer.</p>
申请公布号 KR20060119191(A) 申请公布日期 2006.11.24
申请号 KR20050041821 申请日期 2005.05.18
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, JAE SEUNG
分类号 H01L21/027 主分类号 H01L21/027
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