发明名称 Taking X-ray images with digital solid state detector involves taking new correction image depending on temperature difference at different times, and using to correct subsequent X-ray rough images depending on temperature difference
摘要 <p>The method involves the detector (21) producing a rough image of an investigation object and electronically correcting the image in a correction unit, measuring a temperature at at least one point of the detector at defined time intervals, taking a new correction image depending on the difference in temperatures at different times and using it at least partly to correct subsequent X-ray rough images depending on the temperature difference. An independent claim is also included for a digital solid state detector.</p>
申请公布号 DE102005025429(B3) 申请公布日期 2006.11.23
申请号 DE20051025429 申请日期 2005.06.02
申请人 SIEMENS AG 发明人 HOERNIG, MATHIAS
分类号 G03B42/02;G01N23/04;G01T1/29;H04N5/325 主分类号 G03B42/02
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