发明名称 |
Taking X-ray images with digital solid state detector involves taking new correction image depending on temperature difference at different times, and using to correct subsequent X-ray rough images depending on temperature difference |
摘要 |
<p>The method involves the detector (21) producing a rough image of an investigation object and electronically correcting the image in a correction unit, measuring a temperature at at least one point of the detector at defined time intervals, taking a new correction image depending on the difference in temperatures at different times and using it at least partly to correct subsequent X-ray rough images depending on the temperature difference. An independent claim is also included for a digital solid state detector.</p> |
申请公布号 |
DE102005025429(B3) |
申请公布日期 |
2006.11.23 |
申请号 |
DE20051025429 |
申请日期 |
2005.06.02 |
申请人 |
SIEMENS AG |
发明人 |
HOERNIG, MATHIAS |
分类号 |
G03B42/02;G01N23/04;G01T1/29;H04N5/325 |
主分类号 |
G03B42/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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