发明名称 METHOD AND SYSTEM FOR SCHEDULING TESTS IN A PARALLEL TEST SYSTEM
摘要 An efficient and low-cost method for testing multiple DUTs in a paral1el test system is disclosed. In one embodiment, a method for scheduling tests in a parallel test system having at least two devices-under-test iDUTs jcoupled to a test controller through one or more vendor hardware modules includes receiving a test plan comprising a plurality of tests arranged in a predetermined test flow, where the predetermined test flow comprises a plurality of tests arranged in a directed graph and each test is arranged as a vertex in the directed graph, determining a test execution schedule in accordance with the test plan at runtime, where the test execution schedule identifies a set of next tests to be executed according to current states of the at least two DUTs and where the set of next tests include different tests to be performed on different DUTs, and testing the at least two DUTs using the test execution schedule.
申请公布号 WO2006088238(A1) 申请公布日期 2006.08.24
申请号 WO2006JP303337 申请日期 2006.02.17
申请人 ADVANTEST CORPORATION;PRAMANICK, ANKAN;ADACHI, TOSHIAKI;ELSTON, MARK 发明人 PRAMANICK, ANKAN;ADACHI, TOSHIAKI;ELSTON, MARK
分类号 G01R31/319 主分类号 G01R31/319
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