发明名称 Rapid-response electron-beam deposition system having a controller utilizing leading and trailing deposition indicators
摘要 An electron-beam deposition system includes an evaporation source having a source target with a target location at which a deposition material may be positioned, and a controllable electron-beam source disposed to direct an electron beam at the target location. A trailing-indicator monitor measures a past evaporation performance of the evaporation source and has a trailing-indicator output, and a leading-indicator monitor measures a future evaporation performance of the evaporation source and has a leading-indicator output. A controller receives the trailing-indicator output and the leading-indicator output, and controls the electron-beam source responsive to the trailing-indicator output and to the leading-indicator output. Preferably, the trailing-indicator monitor measures a deposition of the deposition material on a monitored substrate, and the leading-indicator monitor measures a brightness of the deposition material in the evaporation source.
申请公布号 US2006169920(A1) 申请公布日期 2006.08.03
申请号 US20050046484 申请日期 2005.01.28
申请人 RAYTHEON COMPANY, A CORPORATION OF THE STATE OF DELAWARE 发明人 GABURA ANDREW J.;HARRIS GEOFFREY G.
分类号 G01K1/08;H01J3/14;H01J37/08 主分类号 G01K1/08
代理机构 代理人
主权项
地址
您可能感兴趣的专利