| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of generating a clock signal of high frequency suitable for a scan test for an internal circuit of the semiconductor device. <P>SOLUTION: This semiconductor device concerned in the present invention generates the clock signal SCANCLK used for the scan test for the internal circuit 500 of the semiconductor device. The semiconductor device has a scan chain circuit 1 for inputting and outputting a data to/from the internal circuit 500, and a quick clock generator 300 for generating a launching clock signal LAUNCH CLK for launching the data to the internal circuit 500, and a capturing clock signal CAPTURE CLK for capturing the data from the internal circuit 500. The launching clock signal LAUNCH CLK and the capturing clock signal CAPTURE CLK are generated based on the plurality of clock signals different in phases, A pulse width in the plurality of clock signals is smaller than a half of a period in the plurality of clock signals. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
