发明名称 DMOS-transistor with lateral dopant gradient in drift region and method of producing the same
摘要 A DMOS-transistor has a trench bordered by a drift region including two doped wall regions and a doped floor region extending along the walls and the floor of the trench. The laterally extending floor region has a dopant concentration gradient in the lateral direction. For example, the floor region includes at least two differently-doped floor portions successively in the lateral direction. This dopant gradient in the floor region is formed by carrying out at least one dopant implantation from above through the trench using at least one mask to expose a first area while covering a second area of the floor region.
申请公布号 US7064385(B2) 申请公布日期 2006.06.20
申请号 US20040946547 申请日期 2004.09.20
申请人 ATMEL GERMANY GMBH 发明人 DUDEK VOLKER;GRAF MICHAEL
分类号 H01L29/76;H01L21/265;H01L21/336;H01L29/06;H01L29/08;H01L29/78;H01L29/786 主分类号 H01L29/76
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