发明名称 TEST APPARATUS AND WRITE CONTROL CIRCUIT
摘要 A writing control circuit for writing a plurality of pieces of command data supplied from a plurality of host computers onto any of a plurality of register sections is provided which includes a plurality of request signal storing sections provided in a manner to correspond to the plurality of host computers and to store writing request signals supplied from the corresponding host computers, a host selecting section to sequentially select the plurality of request signal storing sections and to receive and output data being stored by the selected request signal storing sections, and a writing section to receive the stored data output by the host selecting section, the command data to be written onto the register section, register section specifying data to specify the register sections onto which the command data is to be written, and to write the command data onto the register sections to be specified by the register section specifying data when the stored data having been received is the writing request signal.
申请公布号 EP1666902(A1) 申请公布日期 2006.06.07
申请号 EP20040787882 申请日期 2004.09.10
申请人 ADVANTEST CORPORATION 发明人 SATOU, HIROSHI
分类号 G01R31/28;G01R31/3183;G01R31/319;G06F1/04;G06F11/00;G06F11/22;G06F11/24;(IPC1-7):G01R31/28 主分类号 G01R31/28
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