发明名称 EFFECTIVE PHOTORESIST STRIPPING PROCESS FOR HIGH DOSAGE AND HIGH ENERGY ION IMPLANTATION
摘要 The present subject matter relates to a method of stripping a photoresist after the photoresist film has been subjected to a high dose and high energy ion implant process. The method involves soaking the photoresist film in DI water, dry etching with oxygen plasma, and immersing in Caro's acid solution to improve the throughput of removing the film from the underlying substrate. The method can also be used to strip photoresist that has been hardened or altered by other types of processes such as dry etch transfer steps and chemical treatments. In some applications, the dry etching step may be omitted from the stripping process or the dry etching step may be combined with the water soak in an integrated process.
申请公布号 US2006088784(A1) 申请公布日期 2006.04.27
申请号 US20040971268 申请日期 2004.10.21
申请人 CHEN FEI-YUN;SHIEH JEN-SHIAN;YUAN HAO-CHIN;HWANG YUAN-KO;CHEN SHIH-SHIUNG 发明人 CHEN FEI-YUN;SHIEH JEN-SHIAN;YUAN HAO-CHIN;HWANG YUAN-KO;CHEN SHIH-SHIUNG
分类号 G03C11/12 主分类号 G03C11/12
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