发明名称 BACK PRESSURE CONTROL SYSTEM FOR CMP AND WAFER POLISHING
摘要 A wafer carrier with a back pressure applicator system adapted to provide high resolution back pressure control. A plurality of millimeter scale distensible elements (42, 43, 44, 45, 46) are disposed between the wafer carrier pressure plate (35) and a process wafer, and selectively distended to provide excess backpressure to select small areas of a wafer known to exhibit resistance to removal vis-à-vis the surrounding wafer surface. Distensible elements may be in the form of expandable pneumatic chambers or electro-mechanical elements such as solenoids, shape memory elements, electrostatic plates.
申请公布号 WO2004109758(A3) 申请公布日期 2005.11.03
申请号 WO2004US16515 申请日期 2004.05.25
申请人 STRASBAUGH 发明人 STRASBAUGH, ALAN
分类号 B24B37/30;B24B49/16 主分类号 B24B37/30
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