发明名称 Linewidth control using an angular distribution of radiation depending on position in the illumination field
摘要 Electromagnetic energy is emitted from an illumination source of a lithography device. A portion of the emitted electromagnetic energy passes through an illumination optics module. The illumination optics module includes a one-dimensional optical transform element (602) having a pupil plane (702). An aperture device having an adjustable aperture is located proximate to the pupil plane so that a portion of the electromagnetic energy recieved by the one-dimensional optical transform element passes through the aperture of the aperture device. The angular distribution of the electromagnetic energy passing through the illumination optics module is adjusted as a function of illumination field position using the aperture device, thereby improving line width control in the lithography device. <IMAGE>
申请公布号 EP1357430(A3) 申请公布日期 2005.09.07
申请号 EP20030008807 申请日期 2003.04.23
申请人 ASML US, INC. 发明人 TSACOYEANES, JAMES G.;COSTON, SCOTT D.
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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