发明名称 |
Linewidth control using an angular distribution of radiation depending on position in the illumination field |
摘要 |
Electromagnetic energy is emitted from an illumination source of a lithography device. A portion of the emitted electromagnetic energy passes through an illumination optics module. The illumination optics module includes a one-dimensional optical transform element (602) having a pupil plane (702). An aperture device having an adjustable aperture is located proximate to the pupil plane so that a portion of the electromagnetic energy recieved by the one-dimensional optical transform element passes through the aperture of the aperture device. The angular distribution of the electromagnetic energy passing through the illumination optics module is adjusted as a function of illumination field position using the aperture device, thereby improving line width control in the lithography device. <IMAGE> |
申请公布号 |
EP1357430(A3) |
申请公布日期 |
2005.09.07 |
申请号 |
EP20030008807 |
申请日期 |
2003.04.23 |
申请人 |
ASML US, INC. |
发明人 |
TSACOYEANES, JAMES G.;COSTON, SCOTT D. |
分类号 |
G03F7/20;H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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