EXEMPT SOURCE FOR AN X-RAY FLUORESCENCE DEVICE

摘要

An x-ray fluorescence (XRF) device and a method for using the same to analyze a sample (11) are described. An X-ray source (20) of the XRF device has a configuration that allows a greater amount of X-rays to impinge on the sample being irradiated with X-rays. An X-ray detector (21) of the XRF device has a configuration that allows a greater amount of X-rays emitted by the sample (11) to impinge on the detector (21). With such a configuration, the size and cost of the X-ray fluorescence device decreases. As well, fewer X-rays are needed from the X-ray source (20) because of the greater efficiency and an exempt X-ray source (exempt from radioactivity licensing requirements) can be used.