METHOD AND STRUCTURE FOR TESTING EMBEDDED ANALOG/MIXED-SIGNAL CORES IN SYSTEM-ON-A-CHIP,申请号KR20000051842-传众专利搜索

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发明名称	METHOD AND STRUCTURE FOR TESTING EMBEDDED ANALOG/MIXED-SIGNAL CORES IN SYSTEM-ON-A-CHIP
摘要
申请公布号	KR100491462(B1)	申请公布日期	2005.05.25
申请号	KR20000051842	申请日期	2000.09.02
申请人		发明人
分类号	G01R31/316;G06F11/00;G01R31/28;G01R31/3167;G01R31/3183;G06F11/22;G06F12/16;G06F15/78;G11C29/02;(IPC1-7):G06F11/00	主分类号	G01R31/316
代理机构		代理人
主权项
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