摘要 |
An organometallic compound having a low melting point, excellent vaporization characteristic and low film formation temperature on a substrate, for forming an iridium-containing thin film by the CVD process is provided. The organometallic iridium compound is represented by the following general formula (1) or (2): wherein R<SUP>1 </SUP>represents hydrogen or a lower alkyl group; R<SUP>2 </SUP>to R<SUP>7 </SUP>each represents hydrogen, a halogen, or the like, provided that specific combinations of R<SUP>1 </SUP>to R<SUP>7 </SUP>are excluded; R<SUP>8 </SUP>represents a lower alkyl group; R<SUP>9 </SUP>to R<SUP>12 </SUP>each represents hydrogen, a halogen, or the like, provided that specific combinations of R<SUP>8 </SUP>to R<SUP>12 </SUP>are excluded. Iridium-containing thin films are produced by using the compound as a precursor by CVD process.
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