发明名称 METHOD FOR FORMING FERROCAPACITORS AND FERAM DEVICES
摘要 <p>A vertical capacitor of an FeRAM device is formed by depositing conductive material and etching it to form electrodes, which are located over openings in an insulating layer so that they are electrically connected to lower levels of the structure. A layer of ferroelectric material is formed on the sides of the electrodes, and etched to a desired, uniform thickness. Conductive material is deposited over the ferroelectric material to form a uniform surface onto which another insulating layer can be deposited. Since this process does not include etching of an insulating layer at a time between the formation of the electrodes and the deposition of the ferroelectric material, no fences of insulating material are formed between them. The geometry can be accurately controlled, to give uniform electric fields and reliable operating parameters.</p>
申请公布号 WO2005031817(A1) 申请公布日期 2005.04.07
申请号 WO2004SG00269 申请日期 2004.08.31
申请人 INFINEON TECHNOLOGIES AG;ZHUANG, HAOREN;BRUCHHAUS, RAINER;EGGER, ULRICH;LIAN, JINGYU;NAGEL, NICOLAS 发明人 ZHUANG, HAOREN;BRUCHHAUS, RAINER;EGGER, ULRICH;LIAN, JINGYU;NAGEL, NICOLAS
分类号 H01L21/02;H01L21/8246;H01L27/115;(IPC1-7):H01L21/02;H01L21/824 主分类号 H01L21/02
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