| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which can easily carry out a production test and can reduce a production test man-labor. SOLUTION: As an output voltage of a VDC(voltage down converter) circuit 20 is A/D converted by a A/D converter 22, the output voltage VDC<SB>out</SB>of the VDC circuit 20 can be observed as a digital quantity and the measurement becomes easy. Preferably, a chip size can be reduced by decreasing the number of terminals 6. Moreover, the terminals 6 used to output the voltage VDC<SB>out</SB>can be used for other use. COPYRIGHT: (C)2005,JPO&NCIPI
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