发明名称 Dual silicon layer for chemical mechanical polishing planarization
摘要 A FinFet-type semiconductor device includes a fin structure on which a relatively thin amorphous silicon layer and then an undoped polysilicon layer is formed. The semiconductor device may be planarized using a chemical mechanical polishing (CMP) in which the amorphous silicon layer acts as a stop layer to prevent damage to the fin structure.
申请公布号 US6812076(B1) 申请公布日期 2004.11.02
申请号 US20040752691 申请日期 2004.01.08
申请人 ADVANCED MICRO DEVICES, INC. 发明人 ACHUTHAN KRISHNASHREE;AHMED SHIBLY S.;WANG HAIHONG;YU BIN
分类号 H01L21/321;H01L21/336;H01L29/49;H01L29/786;(IPC1-7):H01L29/72 主分类号 H01L21/321
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