发明名称 Continuous chemical mechanical polishing process for polishing multiple conductive and non-conductive layers on semiconductor wafers
摘要 A continuous CMP process for polishing multiple conductive and non-conductive layers on a semiconductor substrate. The continuous process comprises the steps of: (a) disposing a substrate on a platen; (b) polishing a first layer using both a mechanical means and a chemical means; and (c) polishing a second layer upon adjusting at least one parameter in either the mechanical means, chemical means, or both.
申请公布号 US6776696(B2) 申请公布日期 2004.08.17
申请号 US20020281905 申请日期 2002.10.28
申请人 PLANAR SOLUTIONS LLC 发明人 MAHULIKAR DEEPAK;JENKINS RICHARD J.
分类号 B24B37/04;C09G1/02;H01L21/321;(IPC1-7):B24B1/00 主分类号 B24B37/04
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