发明名称 Method of etching back of semiconductor wafer
摘要 A resist pattern is formed at an outermost peripheral end of the surface of a wafer. Thereafter, the back of the wafer is back-etched using chemicals to thin the wafer. A passivation film is left behind only at scribe lines for separating semiconductor chips located at the outermost peripheral end of the wafer surface and thereafter the wafer is back-etched.
申请公布号 US2003199164(A1) 申请公布日期 2003.10.23
申请号 US20020259614 申请日期 2002.09.30
申请人 UCHIYAMA AKIRA;KAMATA YUTAKA 发明人 UCHIYAMA AKIRA;KAMATA YUTAKA
分类号 H01L21/306;H01L21/314;H01L21/78;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/306
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