发明名称 PATTERN OF DETECTING QUANTITY OF POLISHING OF LIQUID CRYSTAL DISPLAY PANEL AND POOR POLISHING JUDGEMENT METHOD USING THE SAME
摘要 PURPOSE: A pattern of detecting the quantity of polishing of a liquid crystal display panel and a poor polishing judgement method using the detecting pattern are provided to simplify detection of the quantity of polishing when the edge of a unit liquid crystal display panel is polished. CONSTITUTION: A pattern of detecting the quantity of polishing of a liquid crystal display panel includes at least one alignment mark(150A-150J) and a pattern(102) for identifying the quantity of polishing. The alignment mark is formed at a gate pad and a data pad of a unit liquid crystal display panel(100). The polishing quantity identifying pattern is formed between the end of the gate pad and data pad and the alignment mark. The alignment mark is a tab mark.
申请公布号 KR20030073888(A) 申请公布日期 2003.09.19
申请号 KR20020013643 申请日期 2002.03.13
申请人 LG.PHILIPS LCD CO., LTD. 发明人 CHAE, GYEONG SU;CHOO, HEON JEON;LIM, JONG GO
分类号 G02F1/13;B24B49/12;G02F1/1333;G02F1/1368;(IPC1-7):G02F1/13 主分类号 G02F1/13
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