发明名称 |
PATTERN OF DETECTING QUANTITY OF POLISHING OF LIQUID CRYSTAL DISPLAY PANEL AND POOR POLISHING JUDGEMENT METHOD USING THE SAME |
摘要 |
PURPOSE: A pattern of detecting the quantity of polishing of a liquid crystal display panel and a poor polishing judgement method using the detecting pattern are provided to simplify detection of the quantity of polishing when the edge of a unit liquid crystal display panel is polished. CONSTITUTION: A pattern of detecting the quantity of polishing of a liquid crystal display panel includes at least one alignment mark(150A-150J) and a pattern(102) for identifying the quantity of polishing. The alignment mark is formed at a gate pad and a data pad of a unit liquid crystal display panel(100). The polishing quantity identifying pattern is formed between the end of the gate pad and data pad and the alignment mark. The alignment mark is a tab mark.
|
申请公布号 |
KR20030073888(A) |
申请公布日期 |
2003.09.19 |
申请号 |
KR20020013643 |
申请日期 |
2002.03.13 |
申请人 |
LG.PHILIPS LCD CO., LTD. |
发明人 |
CHAE, GYEONG SU;CHOO, HEON JEON;LIM, JONG GO |
分类号 |
G02F1/13;B24B49/12;G02F1/1333;G02F1/1368;(IPC1-7):G02F1/13 |
主分类号 |
G02F1/13 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|