PROBE CARD AND METHOD OF MANUFACTURING THE SAME

摘要

A probe card and a manufacturing method thereof are provided to enhance reliability and accuracy in an inspection process by preventing a contact error of a probe. A test head(150) is formed to apply test current to a test target. A plurality of probes(110) include tip parts to be electrically connected to the test target. A guide block(100) includes a guide slit(101) and a circuit pattern(120). The probe is stored in the guide slit. The circuit pattern is formed to connect electrically the test head with the probe. A conductive bump(130) is formed on the guide block in order to connect electrically the circuit pattern with the probes.