发明名称 AUTOMATIC INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an automatic inspection apparatus which is provided with compactness not available in conventional cases and which is superior in operability and workability. SOLUTION: The automatic inspection apparatus comprises an inspection apparatus mainframe which inspects a continuously conveyed specimen and an enclosure which is arranged so as to substantially surround the mainframe. The apparatus is constituted in such a way that a control mechanism part which performs at least an operation for an inspection and an operation to sort a nondefective from a defective is housed inside the enclosure, that at least one face of a body wall part constituting the enclosure is provided with a door-shaped member capable of being opened and closed, that the door-shaped member has a function as an operating panel, that a monitor screen which can visually confirm an inspected content is mounted on the operating panel and that a notebook-type personal computer which forms a part of the control mechanism part and in which a personal computer mainframe, a keyboard and a display are integrated is mounted. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003215054(A) 申请公布日期 2003.07.30
申请号 JP20020012317 申请日期 2002.01.22
申请人 KIRIN TECHNO-SYSTEM CORP 发明人 KUBOTA KUNIHIKO
分类号 G01N21/90;G01N35/02;G01N35/04;(IPC1-7):G01N21/90 主分类号 G01N21/90
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