发明名称 Abrasive composition containing organic particles for chemical mechanical planarization
摘要 The present invention is drawn to a composition comprising abrasive particles comprising an organic resin for chemical mechanical planarization (CMP), which can be widely used in the semiconductor industry. The abrasive composition is an aqueous slurry comprising abrasive particles comprising an organic resin, wherein the slurry is held at a pH in the range of 2-12. An attractive feature of the inventive abrasive composition is that it can be tailored to selectively remove different components from the surface. The inventive abrasive composition also provides efficient polishing rates and good surface quality when used in CMP applications.
申请公布号 US2003136055(A1) 申请公布日期 2003.07.24
申请号 US20010023827 申请日期 2001.12.21
申请人 LI YUZHUO;BIAN GUOMIN;TANG KWOK;ZHAO JOE ZUNZI;WESTBROOK JOHN;LIN YONG;CHAN LEINA 发明人 LI YUZHUO;BIAN GUOMIN;TANG KWOK;ZHAO JOE ZUNZI;WESTBROOK JOHN;LIN YONG;CHAN LEINA
分类号 B24B37/00;C09G1/02;C09K3/14;H01L21/304;H01L21/321;(IPC1-7):C09K3/14 主分类号 B24B37/00
代理机构 代理人
主权项
地址