发明名称 Method for electrical interconnection employing salicide bridge
摘要 A method for forming within a substrate employed within a microelectronics fabrication an electrical interconnection cross-over bridging between conductive regions separated by non-conductive regions formed within the substrate. There is formed over a substrate provided with conductive and non-conductive regions a blanket dielectric layer and a blanket polysilicon layer. After patterning the polysilicon and dielectric layers. A portion of the dielectric layer at the periphery of the polysilicon layer is etched away, leaving a gap between the polysilicon patterned layer and the underlying substrate contact region. There is formed over the substrate a layer of refractory metal and after rapid thermal annealing, there is formed a surface layer of refractory metal silicide over the surfaces of the polysilicon layer and within the gap between the polysilicon layer and the substrate, completing the electrical connection.
申请公布号 US2003132521(A1) 申请公布日期 2003.07.17
申请号 US20020292772 申请日期 2002.11.12
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY 发明人 TSENG SHIH-DER;JAO KUO-HO
分类号 H01L21/285;H01L21/768;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 主分类号 H01L21/285
代理机构 代理人
主权项
地址