发明名称 Duty analysis system for a semiconductor integrated circuit and duty analysis method of the same
摘要 A system for analyzing a monolithic integrated circuit includes a logic circuit simulator configured to obtain a cell duty of a primitive cell configuring a logic circuit by performing a logic simulation of the logic circuit based on a netlist of the logic circuit and input vectors for the logic circuit, an analog circuit simulator configured to obtain a transistor duty of a transistor that configures a primitive cell by performing an analog simulation of the primitive cell based on a netlist of the analog circuit of the primitive cell and input vectors for the primitive cell, and a synthesis module configured to obtain a synthesized duty of a transistor of the logic circuit by performing a synthesis of the cell and transistor duties.
申请公布号 US2003126568(A1) 申请公布日期 2003.07.03
申请号 US20020259500 申请日期 2002.09.30
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MURAKAMI HIDEAKI
分类号 G06F17/50;H03K19/00;(IPC1-7):G06F17/50 主分类号 G06F17/50
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