SEMICONDUCTOR TESTER

摘要

A semiconductor tester for testing a semiconductor device by generating pulses of different repetition periods to a DUT having ports of different periods frequencies without using plural timing memories holding timing sets. The semiconductor tester required to generate a timing edge pulse of a period M different from a test period N of the semiconductor tester comprises period converting means capable of generating a timing edge pulse of the period M different from the period N of the test rate without using timing sets that the semiconductor tester has.