发明名称 DEVICE FOR INSPECTING TIP PIECE OF STYLUS
摘要 PROBLEM TO BE SOLVED: To eliminate the influence an image of the tip part of a base acquired by a camera given by materials of the base and a tip piece, a surface finishing condition and an attaching angle, and to make the presence or absence of the tip piece and the shape of the tip piece properly judgeable. SOLUTION: This stylus tip piece inspecting device 10 is provided with a light source 14 and the image picking-up camera 18, a tip part of a stylus 22 is arranged between the light source 14 and the image picking-up camera 18, a projection of the tip part of the stylus 22 by light emitted from the light source 14 is imaged with the camera 18, and the tip piece 26 is inspected based on a projection image-picked up by the camera 18.
申请公布号 JP2003148942(A) 申请公布日期 2003.05.21
申请号 JP20010352081 申请日期 2001.11.16
申请人 TOKYO SEIMITSU CO LTD 发明人 SATO EIICHI
分类号 G01B11/30;G01B11/24;G01B11/26;G01N21/84;(IPC1-7):G01B11/30 主分类号 G01B11/30
代理机构 代理人
主权项
地址