发明名称 Apparatus for self-doping contacts to a semiconductor
摘要 The present invention provides a system and method for creating self-doping contacts to silicon devices in which the contact metal is coated with a layer of dopant and subjected to high temperature, thereby alloying the silver with the silicon and simultaneously doping the silicon substrate and forming a low-resistance ohmic contact to it. A self-doping negative contact may be formed from unalloyed silver which may be applied to the silicon substrate by either sputtering, screen printing a paste or evaporation. The silver is coated with a layer of dopant. Once applied, the silver, substrate and dopant are heated to a temperature above the Ag-Si eutectic temperature (but below the melting point of silicon). The silver liquefies more than a eutectic proportion of the silicon substrate. The temperature is then decreased towards the eutectic temperature. As the temperature is decreased, the molten silicon reforms through liquid-phase epitaxy and while so doing dopant atoms are incorporated into the re-grown silicon lattice. Once the temperature drops below the silver-silicon eutectic temperature the silicon which has not already been reincorporated into the substrate through epitaxial re-growth forms a solid-phase alloy with the silver. This alloy of silver and silicon is the final contact material, and is composed of eutectic proportions of silicon and silver. Under eutectic proportions there is significantly more silver than silicon in the final contact material, thereby insuring good electrical conductivity of the final contact material.
申请公布号 US2003008485(A1) 申请公布日期 2003.01.09
申请号 US20020177880 申请日期 2002.06.20
申请人 MEIER DANIEL L.;DAVIS HUBERT P.;GARCIA RUTH A.;JESSUP JOYCE A. 发明人 MEIER DANIEL L.;DAVIS HUBERT P.;GARCIA RUTH A.;JESSUP JOYCE A.
分类号 H01L31/04;H01L21/228;H01L31/0224;H01L31/0288;H01L31/068;H01L31/18;(IPC1-7):H01L21/425;H01L21/320;H01L21/476;H01L21/44 主分类号 H01L31/04
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