Method for testing a semiconductor integrated circuit

摘要

In the testing method of a semiconductor integrated circuit, setting of a logical state of a plurality of elements that constitute a semiconductor integrated circuit to be measured is sequentially changed. The current value of a static-time power source current passing through the plurality of elements is measured for a plurality of times while the settings are changed. Maximum and minimum values of the current values are obtained. When the difference between the maximum and the minimum value exceeds a predetermined value then it is determined that the semiconductor integrated circuit is a defective product.