发明名称 |
THIN-FILM TRANSISTOR AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a thin-film transistor which uses an interlayer insulating film of high flatness. SOLUTION: In the thin-film transistor, the interlayer insulating film 5 is formed in the upper part of a semiconductor film 101, a gate insulating film 102 and a gate electrode 103; and a metal interconnection 1 is electrically connected to the semiconductor film 101 via a contact hole in the film 5. The film contains a silicon oxide film formed by using liquid silica. Since the flatness of the film 5 which is coated with the liquid silica by a spin-on method so as to be formed is high, the flatness of the thin-film transistor as a whole can be increased.
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申请公布号 |
JP2002033486(A) |
申请公布日期 |
2002.01.31 |
申请号 |
JP20010107761 |
申请日期 |
2001.04.05 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
KODAMA MITSUFUMI;TAKAYAMA ICHIRO |
分类号 |
H01L27/146;H01L21/316;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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