发明名称 |
METHOD FOR MANUFACTURING DIELECTRIC LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A fabrication method of a dielectric layer is provided to stabilize a lower layer by annealing the lower layer before forming the dielectric layer. CONSTITUTION: A lower layer(100) is formed on a semiconductor substrate. Before a dielectric layer is formed on the lower layer(100), the surface of the lower layer(100) is pre-treated by annealing under vacuum or inert gas atmospheres so as to form a silicon oxide, a native oxide or a silicon nitride(150), thereby stabilizing the surface of the lower layer(100). The annealing process is carried out at the temperature of 650 to 950 °C. An RTA(rapid thermal annealing) is used as the annealing process.
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申请公布号 |
KR20010095838(A) |
申请公布日期 |
2001.11.07 |
申请号 |
KR20000019256 |
申请日期 |
2000.04.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, SEONG JE;LEE, BYEONG TAEK;LIM, JAE SUN;PARK, HEUNG SU;PARK, IN SEONG |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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