发明名称 METHOD FOR MANUFACTURING DIELECTRIC LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A fabrication method of a dielectric layer is provided to stabilize a lower layer by annealing the lower layer before forming the dielectric layer. CONSTITUTION: A lower layer(100) is formed on a semiconductor substrate. Before a dielectric layer is formed on the lower layer(100), the surface of the lower layer(100) is pre-treated by annealing under vacuum or inert gas atmospheres so as to form a silicon oxide, a native oxide or a silicon nitride(150), thereby stabilizing the surface of the lower layer(100). The annealing process is carried out at the temperature of 650 to 950 °C. An RTA(rapid thermal annealing) is used as the annealing process.
申请公布号 KR20010095838(A) 申请公布日期 2001.11.07
申请号 KR20000019256 申请日期 2000.04.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, SEONG JE;LEE, BYEONG TAEK;LIM, JAE SUN;PARK, HEUNG SU;PARK, IN SEONG
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
代理机构 代理人
主权项
地址