发明名称 MEASURING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To measure a sample at an appropriate input level by a simple operation by applying a measuring device to a viscoelastic measuring device, etc., to detect the response characteristics, for example, of a solid sample by various parameters. SOLUTION: The response to stimuli is processed by wavelet transform and judged.</p>
申请公布号 JP2001208734(A) 申请公布日期 2001.08.03
申请号 JP20000018048 申请日期 2000.01.25
申请人 A & D CO LTD 发明人 TSUKAMOTO KOKI
分类号 G01N29/09;G01N3/00;G01N11/00;(IPC1-7):G01N29/16 主分类号 G01N29/09
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