发明名称 INNER TEMPERATURE MEASUREMENT OF INTEGRATED DRIVE CIRCUIT INCLUDING SWITCHING CIRCUIT SUPPLYING DRIVE SIGNAL TO DRIVE ELEMENT
摘要 PROBLEM TO BE SOLVED: To measure the inner temperature of a driver IC with high accuracy. SOLUTION: Based on reference temperature information including a predetermined inner temperature reference value of an integrated drive circuit (driver IC) and the output reference value of an inner temperature sensor at the inner temperature reference value, inner temperature of the integrated drive circuit corresponding to the output value of the inner temperature sensor is determined. The reference temperature information is determined by determining the atmospheric temperature of the integrated drive circuit as the inner temperature reference value, and then determining the output value of the inner temperature sensor at the atmospheric temperature as the output reference value. Alternatively, it is determined by reading out the reference temperature information provided readably on a print head unit.
申请公布号 JP2001205796(A) 申请公布日期 2001.07.31
申请号 JP20000019497 申请日期 2000.01.28
申请人 SEIKO EPSON CORP 发明人 TAMURA NOBORU
分类号 B41J2/01;G01K1/14;H01L41/09;(IPC1-7):B41J2/01 主分类号 B41J2/01
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