发明名称 METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to prevent a lower electrode from being oxidized by forming a dielectric layer and performing a curing process before the lower electrode is fabricated. CONSTITUTION: An insulating layer is formed on a semiconductor substrate(21) and selectively patterned to form a contact hole. A plug layer(24) is formed to bury the contact hole. An insulating pattern layer is formed on the plug layer. A dielectric layer(26) is formed on the entire surface, and a curing process is carried out. An upper electrode layer of a capacitor is formed between the insulating pattern layers having the dielectric layer, and the insulating pattern layers are eliminated. A lower electrode layer of the capacitor is formed in a portion where the insulating pattern layer is eliminated.
申请公布号 KR20010045226(A) 申请公布日期 2001.06.05
申请号 KR19990048433 申请日期 1999.11.03
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SON, SANG HO
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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