DEVICE FOR TESTING HIGH SPEED SEMICONDUCTOR DEVICE USING LOW SPEED TESTING DEVICE

摘要

PURPOSE: A device for testing a high speed semiconductor device is provided to test a semiconductor device acting with high speed using a low speed testing device in producing a high speed clock signal by adding a clock generator in external. CONSTITUTION: A device for testing a semiconductor device comprises a tester, a clock generator, a semiconductor device to be tested and a frequency demultiplier. The tester is capable of generating an appointed bit of controlling signal, a first clock signal with low frequency and an opposed clock signal against the first clock signal. The clock generator inputs the first clock signal and the opposed first clock signal and generates a second clock signal with higher frequency than the first clock signal and the opposed clock signal against the second clock signal. The semiconductor device to be tested is clocked by response to the second clock signal and the opposed second clock signal and is tested with a test data introduced from the tester. The frequency demultiplier converts the second clock signal and the opposed second clock signal to the clock signal with low frequency and outputs the converted clock signal with low frequency and the opposed clock signal with low frequency as the clock monitoring signal and the opposed clock monitoring signal.