发明名称 |
Built-in self-test circuit for read channel device |
摘要 |
A BIST circuit for use with a read channel device is disclosed that utilizes internally generated clock and control signals to control a test sequence. A linear feedback shift register is used as the signature analysis register. The test signature accumulation process is controlled by clock and control signals internal to the read charnel device that are associated with the normal operation of the read channel device.
|
申请公布号 |
US6163865(A) |
申请公布日期 |
2000.12.19 |
申请号 |
US19980120396 |
申请日期 |
1998.07.22 |
申请人 |
LUCENT TECHNOLOGIES, INC. |
发明人 |
KEMPSEY, PATRICK WALLACE |
分类号 |
G01R31/3185;G06F11/267;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3185 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|