发明名称 Method for production of semiconductor device
摘要 A method for the production of a semiconductor device having an electrode line formed in a semiconducting substrate is disclosed which comprises preparing a semiconducting substrate having trenches and/or contact holes formed preparatorily in a region destined to form the electrode line, forming a conductive film formed mainly of at least one member selected from among Cu, Ag, and Au on the surface of the semiconducting substrate, heat-treating the superposed Cu film while supplying at least an oxidizing gas thereto thereby flowing the Cu film to fill the trenches and/or contact holes, and removing by polishing the part of the conductive film which falls outside the region of the electrode line and completing the electrode lines consequently. During the heat treatment, a reducing gas is supplied in addition to the oxidizing gas to induce a local oxidation-reduction reaction and fluidify and/or flow the conductive film and consequently accomplish the embodiment of the conductive film in the trenches.
申请公布号 US6090701(A) 申请公布日期 2000.07.18
申请号 US19950521088 申请日期 1995.06.20
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HASUNUMA, MASAHIKO;ITO, SACHIYO;SHIMAMURA, KEIZO;KANEKO, HISASHI;HAYASAKA, NOBUO;TSUTSUMI, JUNSEI;KAJITA, AKIHIRO;WADA, JUNICHI;OKANO, HARUO
分类号 H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/768
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